鈥淟ow Energy Ion Scattering Spectroscopy (LEIS) can provide the elemental composition of the outermost atomic layer of a material by probing it with a 1 鈥� 10 keV beam of noble gas ions.听There isn鈥檛 another way to get this kind of information about the outermost layer of atoms in a material. Studying this layer plays a critical role in understanding a material鈥檚 catalytic, wetting, adhesion, frictional properties, etc. To our knowledge, the LEIS system, IONTOF's Qtac100, is the second Qtac in the USA. It is equipped with special sample preparation chambers. Furthermore, without breaking vacuum, sample can be transferred from and to the Kratos SUPRA XPS (X-ray Photoelectron Spectroscopy) system, which is a complementary surface analysis technique.
Our presenter is Dr. Philipp Bruner, Senior Research Scientist at IONTOF GmbH. Philip has been a research scientist at IONTOF for over 10 years now in the R &D section, working on ToF-SIMS and LEIS instrumentation鈥�
Registration can be completed online.听Email Jugessur with any questions.